Attachments for reflexion and remission measurements

Attachments for measuring reflexion and remission provide the analysis of refraction index, layer thickness or color of liquid, solid or powder samples. This way for instance material analyses or the determination of purity can be carried out very easy.

	Absolute reflectance attachment V/W optical configuration for the determination of the reflectance at plane surfaces and layers.
	11°- 60° variable angle reflectance attachment For the examination of solid surfaces, film systems and their interfaces.
	Reflectance attachment with spectralon integrating sphere For transmittance and reflectance measurements of solid, powdery and liquid samples.
	Holder for solid samples Holds foils, sample plates or similar solid samples for transmittance measurements.
	Scanning attachment for solid samples The scanning attachment for solid samples provides locally resolved spectra for large-scale, solid, transparent samples.